Rugged single-ended 20 GHz probe for direct probing
S-Probe series of single-ended probes can perform up to 20 GHz are designed for RF, power integrity, and signal integrity testing. Its strong beryllium copper (BeCu) tips is perfect for direct probing of uneven surfaces, such as solder pads and circuit components. This is a big improvement over the fragile microprobes.
S-Probe Specifications
- Bandwidth:
20 GHz (0.25/0.4/0.5 mm)18 GHz (0.8/1.0 mm)16 GHz (1.2/1.4/1.6 mm) - Insertion Loss: less than 3 dB
- Impedance: 50±2 Ohm
- Connector Type: SMA Female
- Size: 38 x 20 x 12 mm (1.5 x 0.8 x 0.5 in)
- Availability: Now
S-Probe Part Information
- SP-GR-2015025 – 20 GHz, 0.25 mm pitch
- SP-GR-201504 – 20 GHz, 0.4 mm pitch
- SP-GR-201505 – 20 GHz, 0.5 mm pitch
- SP-GR-181508 – 18 GHz, 0.8 mm pitch
- SP-GR-181510 – 18 GHz, 1.0 mm pitch
- SP-GR-161512 – 16 GHz, 1.2 mm pitch
- SP-GR-161514 – 16 GHz, 1.4 mm pitch
- SP-GR-161516 – 16 GHz, 1.6 mm pitch
Highlights
- High Bandwidth: DC to 20 GHz
- Low Insertion Loss: < 3 dB @ 20 GHz for probe pitch < 1 mm
- Ruggedness: Strong enough for direct probing test pads on uneven surfaces
- Probe-tip Calibration: accurate measurements without the need of soldering semi-rigid RF cables
- High Repeatability: No moving parts
- View S-Probe datasheet.
Constant shrinking size of circuit components makes soldering semi-rigid RF cables to test gigahertz circuits impractical. The rugged S-Probe and its calibration substrate (TCS60) allow engineers to perform probe-tip calibration for accurate, repetitive measurements.
The user experience of S-Probe is similar to that of the microprobe. Precision Positioner TP300 allows an engineer to switch between S-Probe (through TP300-PA Probe Adapter) and the microprobe easily.
S-Probe Demonstrations
Two S-Probes used in 2XThru testing
Two S-Probes used in 2XThru testing
