For the fourth consecutive year, PacketMicro will exhibit at DesignCon. Please come visit us to review our new S-Probes, D-Probes, USB3.1 Type-C fixture and SFD de-embedding software for your high-speed probing needs.
Place: Santa Clara Convention Center, Santa Clara, California
Exhibition: January 20-21, 2016, 12:30 pm – 6 pm
PacketMicro Booth: #753
Exhibition: January 20-21, 2016, 12:30 pm – 6 pm
PacketMicro Booth: #753
PacketMicro will demonstrated the recently announced world’s most rugged single-ended and differential high-speed probes for RF, Signal Integrity and Power Integrity probing at DesignCon 2016.
Single-ended S-Probe: Supports probe pitches from 0.25 mm to 1.6 mm with speed up to 20 GHz.
Visit S-Probe product page.
Visit S-Probe product page.
Differential D-Probe: Supports probe pitches from 0.5 mm to 1. mm with speed up to 18 GHz.
Visit D-Probe product page.
Visit D-Probe product page.
PacketMicro will demonstrate test fixture for USB 3.1 Type-C cable testing.
Contact PacketMicro for more information.
Contact PacketMicro for more information.
The Smart Fixture De-embedding (SFD) Tool is simple and accurate, which can be used to extract high-bandwidth models of interconnects, such as circuit board traces and vias, connectors, IC packages, and cables.
Visit SFD product page.
Contact PacketMicro for more information about the software and pricing.
Visit SFD product page.
Contact PacketMicro for more information about the software and pricing.
