For the fourth consecutive year, PacketMicro will exhibit at DesignCon. Please come visit us to review our new S-Probes, D-Probes, USB3.1 Type-C fixture and SFD de-embedding software for your high-speed probing needs.
Place: Santa Clara Convention Center, Santa Clara, California
Exhibition: January 20-21, 2016, 12:30 pm – 6 pm
PacketMicro Booth: #753
PacketMicro will demonstrated the recently announced world’s most rugged single-ended and differential high-speed probes for RF, Signal Integrity and Power Integrity probing at DesignCon 2016.